SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation
Kniazewski, Pawel, Ottevaere, Heidi, DeWolf, Peter, Kujawinska, Malgorzata, Berghmans, Francis, Wiersma, Diederik S., Fernandez, Alberto, Goussarov, Andrei, Van Uffelen, MarcoVolume:
5858
Year:
2005
Language:
english
DOI:
10.1117/12.612932
File:
PDF, 616 KB
english, 2005