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SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Machine Vision Applications in Industrial Inspection XIV - Twin and scratch detection and removal in micrograph images of Inconel 718
Jakob, Gerhard, Rinnhofer, Alfred, Bischof, Horst, Benesova, Wanda, Meriaudeau, Fabrice, Niel, Kurt S.Volume:
6070
Year:
2006
Language:
english
DOI:
10.1117/12.642635
File:
PDF, 1.31 MB
english, 2006