SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2007 - San Jose, CA, USA (Sunday 28 January 2007)] Machine Vision Applications in Industrial Inspection XV - Face recognition by using ring rotation invariant transform and coping with image rotation and image shifting problems

Su, Ching-Liang, Meriaudeau, Fabrice, Niel, Kurt S.
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Volume:
6503
Year:
2007
Language:
english
DOI:
10.1117/12.707236
File:
PDF, 313 KB
english, 2007
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