SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Realisation of quantitative Makyoh topography using a digital micromirror device
Riesz, Ferenc, Lukács, I. E., Makai, J. P., Osten, Wolfgang, Gorecki, Christophe, Novak, Erik L.Volume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.726388
File:
PDF, 728 KB
english, 2007