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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Optical constants measurement system for α:H silicon film
Jiang, Quan, Pan, Junhua, Wyant, James C., Lin, Zu-lun, Cheng, Jian-bo, Wang, Hexin, Qi, Kang-cheng, Ge, Chang-junVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.783833
File:
PDF, 286 KB
english, 2007