SPIE Proceedings [SPIE International Symposium on Instrumentation Science and Technology - Shenyang, China (Monday 15 September 2008)] Fifth International Symposium on Instrumentation Science and Technology - Applied strategy for options of invasive and non-invasive sensors and instruments
Yan, Zhang, Tan, Jiubin, Wen, Xianfang, Xin, Liu, Scopesi, Fabio, Serra, Giovanni, Sun, Jinwei, Rolfe, PeterVolume:
7133
Year:
2008
Language:
english
DOI:
10.1117/12.808614
File:
PDF, 131 KB
english, 2008