SPIE Proceedings [SPIE BiOS - San Francisco, California (Saturday 23 January 2010)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII - Self-reference extended depth-of-field quantitative phase microscopy
Jang, Jaeduck, Conchello, Jose-Angel, Cogswell, Carol J., Bae, Chae Yun, Park, Je-Kyun, Wilson, Tony, Brown, Thomas G., Ye, Jong ChulVolume:
7570
Year:
2010
Language:
english
DOI:
10.1117/12.843082
File:
PDF, 1.26 MB
english, 2010