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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI - Effectiveness assessment of signal processing in the presence of smear

Bijl, Piet, Holst, Gerald C., Krapels, Keith A., Beintema, Jaap A., Dijk, J., van der Leden, Natasja
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Volume:
7662
Year:
2010
Language:
english
DOI:
10.1117/12.850132
File:
PDF, 499 KB
english, 2010
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