SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense - Effect of periodic roughness and surface defects on the terahertz scattering behavior of cylindrical objects
Jagannathan, A., Anwar, Mehdi, Dhar, Nibir K., Gatesman, A. J., Horgan, T., Crowe, Thomas W., Goyette, T., Coulombe, M., Giles, R. H., Nixon, W. E.Volume:
7671
Year:
2010
Language:
english
DOI:
10.1117/12.852909
File:
PDF, 4.75 MB
english, 2010