SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing...

  • Main
  • SPIE Proceedings [SPIE SPIE Defense,...

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense - Effect of periodic roughness and surface defects on the terahertz scattering behavior of cylindrical objects

Jagannathan, A., Anwar, Mehdi, Dhar, Nibir K., Gatesman, A. J., Horgan, T., Crowe, Thomas W., Goyette, T., Coulombe, M., Giles, R. H., Nixon, W. E.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
7671
Year:
2010
Language:
english
DOI:
10.1117/12.852909
File:
PDF, 4.75 MB
english, 2010
Conversion to is in progress
Conversion to is failed