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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Interferometry XV: Applications - Using a Savart plate in optical metrology
Blain, P., Furlong, Cosme, Gorecki, Christophe, Michel, F., Renotte, Y., Novak, Erik L., Habraken, S.Volume:
7791
Year:
2010
Language:
english
DOI:
10.1117/12.860177
File:
PDF, 3.42 MB
english, 2010