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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 1 August 2010)] Infrared Remote Sensing and Instrumentation XVIII - Far-IR measurements at Cerro Toco, Chile: FIRST, REFIR, and AERI

Cageao, Richard P., Strojnik, Marija, Paez, Gonzalo, Alford, J. Ashley, Johnson, David G., Kratz, David P., Mlynczak, Martin G.
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Volume:
7808
Year:
2010
Language:
english
DOI:
10.1117/12.862601
File:
PDF, 1.05 MB
english, 2010
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