SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Interference of convergent polarized light to test crystal optical surface
Duan, Cun-li, Zhang, Yudong, Sasián, José, Zhang, Su-juan, Hu, Xiao-ying, Xiang, Libin, Lu, Shao-jun, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.866739
File:
PDF, 286 KB
english, 2010