SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Calibration and image enhancement algorithm of portable structured light 3D gauge system for improving accuracy
Tao, Li, Harding, Kevin, Huang, Peisen S., Harding, Kevin, Jia, Ming, Yoshizawa, Toru, Song, GuijuVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.872022
File:
PDF, 710 KB
english, 2010