SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies - Constanta, Romania (Thursday 26 August 2010)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V - High accuracy laser based machine vision for calibration of linear encoders and dial instruments
Iordache, Iuliana, Schiopu, Paul, Caruntu, George, Schiopu, Paul, Apostol, Dan, Damian, VictorVolume:
7821
Year:
2010
Language:
english
DOI:
10.1117/12.882819
File:
PDF, 3.68 MB
english, 2010