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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 21 August 2011)] Nanostructured Thin Films IV - Electron microscopy characterization of some carbon based nanostructures with application in divertors coatings from fusion reactor
Ciupina, V., Martín-Palma, Raúl J., Jen, Yi-Jun, Morjan, I., Lungu, C. P., Mackay, Tom G., Vladoiu, R., Prodan, G., Prodan, M., Zarovschi, V., Porosnicu, C., Stanescu, I. M., Contulov, M., Mandes, A.,Volume:
8104
Year:
2011
Language:
english
DOI:
10.1117/12.892198
File:
PDF, 7.45 MB
english, 2011