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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Imaging Spectrometry XVI - Enhanced DIRSIG scene simulation by incorporating process models
Sun, Jiangqin, Shen, Sylvia S., Lewis, Paul E., Messinger, David, Gartley, MichaelVolume:
8158
Year:
2011
Language:
english
DOI:
10.1117/12.893956
File:
PDF, 801 KB
english, 2011