SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - Research on the measurement method of geometric parameters of microstructure fiber end based on machine vision
Geng, Tao, Diao, JunQiang, Yang, YuanVolume:
8200
Year:
2012
Language:
english
DOI:
10.1117/12.906691
File:
PDF, 890 KB
english, 2012