SPIE Proceedings [SPIE SPIE OPTO - San Francisco,...

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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 21 January 2012)] Advances in Display Technologies II - Pixel structure for higher optical efficiency in the patterned vertical alignment LC mode

Park, Byung Wok, Chien, Liang-Chy, Lee, Sin-Doo, Jeon, Eun-Young, Kim, Ki-Han, Wu, Ming Hsien, Song, Dong Han, Lee, Ji-Hoon, Lee, Gak Seok, Shin, Ki-Chul, Kim, Hee Seop, Yoon, Tae-Hoon
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Volume:
8280
Year:
2012
Language:
english
DOI:
10.1117/12.913569
File:
PDF, 2.31 MB
english, 2012
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