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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Interferometry XVI: Techniques and Analysis - Diffraction effects for interferometric measurements due to imaging aberrations
Zhou, Ping, Zhao, Chunyu, Burge, James, Schmit, Joanna, Creath, Katherine, Towers, Catherine E., Burke, JanVolume:
8493
Year:
2012
Language:
english
DOI:
10.1117/12.930104
File:
PDF, 1.58 MB
english, 2012