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SPIE Proceedings [SPIE Technical Symposium Southeast - Orlando, FL (Monday 18 May 1987)] Metrology of Optoelectronic Systems - Quality Merit Function In Specifications Of Hard Copy Devices
Gur, Yigal, O'Donnell, Francis X. D., Granger, Edward M.Volume:
776
Year:
1987
Language:
english
DOI:
10.1117/12.940452
File:
PDF, 6.20 MB
english, 1987