SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - Study Of Multilayers Subjected To Intense Radiation
Knight, L. V., Gray, K. J., Peterson, B. G., Thorne, J. M., Perkins, R. T., Koch, E., Schmahl, Guenther A.Volume:
733
Year:
1986
Language:
english
DOI:
10.1117/12.964938
File:
PDF, 333 KB
english, 1986