Sigmoid-growth curve of lattice-constant against...

Materials Science in Semiconductor Processing 2016 / 10 Vol. 53

Sigmoid-growth curve of lattice-constant against annealing-temperature of Cd1−xZnxTe thin films and its structural, optical and morphological characteristics

Chakraborty, Monisha, Bhattacharyya, Sugata
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
53
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2016.06.003
Date:
October, 2016
File:
PDF, 1.87 MB
english, 2016
Conversion to is in progress
Conversion to is failed