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SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Scanning Probe Microscopies II - Stand-alone atomic force microscope featuring large, scan friction measurement, atomic resolution, and capability of liquid operation
Putman, Constant A., van der Werf, Kees O., de Grooth, Bart G., van Hulst, Niko F., Greve, Jan, Williams, Clayton C.Volume:
1855
Year:
1993
Language:
english
DOI:
10.1117/12.146378
File:
PDF, 985 KB
english, 1993