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SPIE Proceedings [SPIE 1994 North American Conference on Smart Structures and Materials - Orlando, FL (Sunday 13 February 1994)] Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation - Phase-strain model for polarimetric strain sensors based on fictitious residual strains
Lo, Yu-Lung, Nielsen, Peter L., Sirkis, James S., Sirkis, James S.Volume:
2191
Year:
1994
Language:
english
DOI:
10.1117/12.173978
File:
PDF, 222 KB
english, 1994