SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Imaging and Illumination for Metrology and Inspection - Detecting and characterizing small voids in mostly diffuse materials
Wittels, Norman, El-Korchi, Tahar, Li, Yinhong, Gennert, Michael A., Svetkoff, Donald J.Volume:
2348
Year:
1994
Language:
english
DOI:
10.1117/12.198832
File:
PDF, 556 KB
english, 1994