SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Imaging and Illumination for Metrology and Inspection - Large-angle incoherent structured light projector
Bieman, Leonard H., Michniewicz, Mark A., Svetkoff, Donald J.Volume:
2348
Year:
1994
Language:
english
DOI:
10.1117/12.198839
File:
PDF, 210 KB
english, 1994