SPIE Proceedings [SPIE Microlithography '90, 4-9 Mar, San...

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SPIE Proceedings [SPIE Microlithography '90, 4-9 Mar, San Jose - San Jose, CA (Sunday 4 March 1990)] Electron-Beam, X-Ray, and Ion-Beam Technology: Submicrometer Lithographies IX - Focused ion-beam-assisted deposition of tungsten

Madokoro, Yuichi, Ohnishi, Tsuyoshi, Ishitani, Tohru, Resnick, Douglas J.
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Volume:
1263
Year:
1990
Language:
english
DOI:
10.1117/12.20174
File:
PDF, 343 KB
english, 1990
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