SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Interferometry VII: Applications - Optoelectronic feedback system for measuring the shape of large format objects
Sainov, Ventseslav C., Stoilov, Georgi, Tontchev, Dimitar A., Dragostinov, Todor, Dimitrova, Aneta, Pryputniewicz, Ryszard J., Brown, Gordon M., Jueptner, Werner P. O.Volume:
2545
Year:
1995
Language:
english
DOI:
10.1117/12.212664
File:
PDF, 808 KB
english, 1995