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SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Machine Vision Applications in Industrial Inspection IV - Triangulation and surface inspection in the automatic inspection of drillings and hollows
Kleuver, Wolfram, Fuss, Michael, Rao, A. Ravishankar, Chang, NingVolume:
2665
Year:
1996
Language:
english
DOI:
10.1117/12.232237
File:
PDF, 731 KB
english, 1996