SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Resonant scanning tunneling optical microscope
Bainier, Claudine, Courjon, Daniel A., Salvi, J., Baida, Fadi, Girard, Christian, Vigoureux, Jean-Marie, Castiaux, A., Gorecki, ChristopheVolume:
2782
Year:
1996
Language:
english
DOI:
10.1117/12.250788
File:
PDF, 814 KB
english, 1996