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SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Using IDD to analyze analog faults and development of a sensor
Maidon, Yvan, Deval, Yann, Fremont, Helene, Dom, Jean P., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-DieterVolume:
2874
Year:
1996
Language:
english
DOI:
10.1117/12.250823
File:
PDF, 516 KB
english, 1996