SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - High-speed computer color testing and matching system online
Li, Jianbai, Zao, Anqing, Lei, Changyu, Chan, Xuegen, Li, Xiaoyun, Zhang, Xiaoli, Ying, Aihan, Wan, Xiong, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253015
File:
PDF, 119 KB
english, 1996