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SPIE Proceedings [SPIE Photonics East '96 - Boston, MA (Monday 18 November 1996)] Advanced Sensor and Control-System Interface - Condition monitoring of production lines using event-time observers
Gazarik, Michael J., Kamen, Edward W., Nnaji, Bartholomew O.Volume:
2911
Year:
1996
Language:
english
DOI:
10.1117/12.262500
File:
PDF, 766 KB
english, 1996