SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Grazing Incidence and Multilayer X-Ray Optical Systems - Spectral fitting in AXAF calibration detectors
Edgar, Richard J., Tsiang, Eugene Y., Tennant, Allyn F., Vitek, S. A., Swartz, Douglas A., Hoover, Richard B., Walker II, Arthur B. C.Volume:
3113
Year:
1997
Language:
english
DOI:
10.1117/12.278841
File:
PDF, 342 KB
english, 1997