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SPIE Proceedings [SPIE Optoelectronics and High-Power Lasers & Applications - San Jose, CA (Saturday 24 January 1998)] Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II - Statistical process control by employing circular and spherical statistics for the interpretation of BRDF measurements
Rothe, Hendrik, Hueser, Dorothee, Kasper, Andre, Stover, John C.Volume:
3275
Year:
1998
Language:
english
DOI:
10.1117/12.304389
File:
PDF, 1.23 MB
english, 1998