![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Machine Vision Systems for Inspection and Metrology VII - Image processing benchmark study
Miller, John W. V., Eddy, C., Waltz, Frederick M., Hack, Ralf, Wood, James, Stokes, D., Batchelor, Bruce G., Miller, John W. V., Solomon, Susan S.Volume:
3521
Year:
1998
Language:
english
DOI:
10.1117/12.326968
File:
PDF, 598 KB
english, 1998