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SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Machine Vision Applications in Industrial Inspection VII - Improving the processing speed of an optoelectronic morphological industrial inspection processor
Liu, Haisong, Wu, Minxian, Jin, Guofan, He, Qingsheng, Yan, Yingbai, Tobin, Jr., Kenneth W., Chang, Ning S.Volume:
3652
Year:
1999
Language:
english
DOI:
10.1117/12.341140
File:
PDF, 1.11 MB
english, 1999