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SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Optical Pattern Recognition X - Wavelet-based two-dimensional corner detection
Wang, Zhan, Huang, Fukan, Wan, Jianwei, Casasent, David P., Chao, Tien-HsinVolume:
3715
Year:
1999
Language:
english
DOI:
10.1117/12.341309
File:
PDF, 512 KB
english, 1999