SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks - Quality discrimination method for write-once optical disk
Kim, Hyung-Kyu, Yeo, Woon-Seong, Bae, Dongseok, Podio, Fernando L.Volume:
3806
Year:
1999
Language:
english
DOI:
10.1117/12.371159
File:
PDF, 214 KB
english, 1999