SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Microsystems Engineering: Metrology and Inspection - Microphotogrammetry for 3D strain measurement and microassembly control
Tutsch, Rainer, Ritter, Reinhold, Ispas, Diana, Petz, Marcus, Casarotto, Leobaldo, Gorecki, Christophe, Jueptner, Werner P. O., Kujawinska, MalgorzataVolume:
4400
Year:
2001
Language:
english
DOI:
10.1117/12.445602
File:
PDF, 965 KB
english, 2001