SPIE Proceedings [SPIE Optics, Electro-Optics, and Laser Applications in Science and Engineering - Los Angeles, CA (Sunday 20 January 1991)] Applied Spectroscopy in Material Science - Infrared microanalysis of contaminants at grazing incidence
Reffner, John A., Saperstein, David D.Volume:
1437
Year:
1991
Language:
english
DOI:
10.1117/12.45135
File:
PDF, 245 KB
english, 1991