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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Optical Manufacturing and Testing IV - Measurement of the dynamic deformation of a high-frequency scanning mirror using a Shack-Hartmann wavefront sensor
Brown, Margaret K., Gong, Timothy J., Neal, Daniel R., Roller, James P., Luanava, Selso, Urey, Hakan, Stahl, H. PhilipVolume:
4451
Year:
2001
Language:
english
DOI:
10.1117/12.453645
File:
PDF, 458 KB
english, 2001