SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Technology improvement of raising optical tomography resolution
Shi, Zhiwei, Li, Yang, Zhang, Guangjun, Zhao, Huijie, Wang, ZhongyuVolume:
5253
Year:
2003
Language:
english
DOI:
10.1117/12.521669
File:
PDF, 86 KB
english, 2003