SPIE Proceedings [SPIE Photonics Europe - Strasbourg,...

  • Main
  • SPIE Proceedings [SPIE Photonics Europe...

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - A general framework for three-dimensional surface reconstruction by self-consistent fusion of shading and shadow features and its application to industrial quality inspection tasks

Hafezi, Kia, Osten, Wolfgang, Takeda, Mitsuo, Wohler, Christian
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.545454
File:
PDF, 1.02 MB
english, 2004
Conversion to is in progress
Conversion to is failed