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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - A general framework for three-dimensional surface reconstruction by self-consistent fusion of shading and shadow features and its application to industrial quality inspection tasks
Hafezi, Kia, Osten, Wolfgang, Takeda, Mitsuo, Wohler, ChristianVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.545454
File:
PDF, 1.02 MB
english, 2004