SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Coherent optical metrology in virtual reality
Kornis, Janos, Osten, Wolfgang, Takeda, MitsuoVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.546713
File:
PDF, 2.27 MB
english, 2004