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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Developments in X-Ray Tomography IV - Beam hardening correction and quantitative micro-CT
Prevrhal, Sven, Bonse, UlrichVolume:
5535
Year:
2004
Language:
english
DOI:
10.1117/12.559976
File:
PDF, 300 KB
english, 2004