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SPIE Proceedings [SPIE Optics East - Philadelphia, PA (Monday 25 October 2004)] Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Design and fabrication of digital dual-frequency patterns for projected fringe profilometry
Su, Wei-Hung, Hsu, Yi-Ling, Kuo, Cho-Yo, Chen, Hong-Ming, Su, Wei-Chen, Yin, Shizhuo, Harding, Kevin G.Volume:
5606
Year:
2004
Language:
english
DOI:
10.1117/12.569992
File:
PDF, 112 KB
english, 2004