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SPIE Proceedings [SPIE Microtechnologies for the New Millennium 2005 - Sevilla, Spain (Monday 9 May 2005)] VLSI Circuits and Systems II - Voltage to frequency converter for DAC test
Hogan, John, Farrell, Ronan, Lopez, Jose F., Fernandez, Francisco V., Lopez-Villegas, Jose Maria, de la Rosa, Jose M.Volume:
5837
Year:
2005
Language:
english
DOI:
10.1117/12.608479
File:
PDF, 268 KB
english, 2005