SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Recent Developments in Traceable Dimensional Measurements III - Performance assessment of involute gear measurement by CMM using a double-ball artifact
Takatsuji, Toshiyuki, Decker, Jennifer E., Peng, Gwo-Sheng, Kondo, Koshi, Kubo, Aizo, Haertig, Frank, Osawa, Sonko, Naoi, Kazuya, Kurosawa, Tomizo, Komori, MasaharuVolume:
5879
Year:
2005
Language:
english
DOI:
10.1117/12.614851
File:
PDF, 403 KB
english, 2005