SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII - Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements
Su, Wei-Hung, Yu, Francis T. S., Guo, Ruyan, Huang, Chia-Jeng, Yin, ShizhuoVolume:
6314
Year:
2006
Language:
english
DOI:
10.1117/12.679505
File:
PDF, 333 KB
english, 2006